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Description
This
talk will cover a variety of ongoing efforts at the National Institute of
Standards and Technology (NIST) to understand and overcome metrological
challenges posed by in-process monitoring of metal additive manufacturing (AM)
processes. It will provide a brief overview of the Measurement Science for
Additive Manufacturing (SMAS) Program, and the goals of the Metrology for
Real-time Monitoring of AM project. These goals can be divided into two areas:
research-based efforts to advance the current state of in-process monitoring
technologies, and standardization efforts to promote principles and guidelines
for those aspects of in-process monitoring that are mature enough to
standardize. The talk will provide a brief overview of some of NIST's
standardization efforts in ASTM E07 and F42, and preview some of the NIST
research aimed at identifying best methods for calibration and characterization
of AM in-process monitoring systems, data management and transport, and data
registration. Finally, the talk will discuss current trends and activities in
the areas of AM in-process monitoring, and provide some outlooks on how these
technologies and associated standards may evolve.