FCMN 2007
27 Presentations
-
-
Invited Oral Presentation: Nanoscale Contact Formation Dynamics
-
Invited Oral Presentation: Multiple Modulation and Higher Harmonic SPM Probing Complex Properties
-
Invited Oral Presentation: CEA-LETI as a European Model of Cooperation in Nanoelectronics
-
Invited Oral Presentation: Doping of Nanostructures
-
Invited Oral Presentation: Review of NSOM Microscopy for Materials
-
Invited Oral Presentation: The Impact of Nano-Sized Dimensions on Characterization and Metrology
-
Invited Oral Presentation: Raman Antenna Effect in Semiconducting Nanowires
-
Invited Oral Presentation: 3D Imaging of Nanostructures Using Electron Tomography, and the Impact of Aberration Correctors
-
Invited Oral Presentation: Metrology for Emerging Research Materials and Devices
-
Invited Oral Presentation: Analytics and Metrology for Locally Strained Silicon in CMOS Devices
-
Invited Oral Presentation: From Microchips to Nanochips: How We Got Here...and...Where Do We Go From Here
-
Invited Oral Presentation: NIST: Promoting U.S. Innovation and Industrial Competitiveness
-
Invited Oral Presentation: Metrology and Characterization for Extending Silicon CMOS
-
Invited Oral Presentation: LEAP Tomography and the Rapidly Expanding World of Microelectronic Applications
-
Invited Oral Presentation: Advanced Metrology for Nanoelectronics at the National Institute for Standards and Technology
-
Invited Oral Presentation: What Is 3D IC Integration and What Metrology Is Needed?
-
Invited Oral Presentation: Nanoelectronics: Computation and Metrology
-
Invited Oral Presentation: Optical Characterization Methods for Identifying Charge Trapping States in Thin Dielectric Films
-
Invited Oral Presentation: Atom Probe Tomography for Semiconductor Applications
-
Invited Oral Presentation: Self-assembled Monolayers: Surface Engineering and Characterization
-
Invited Oral Presentation: Metrology and Precision for Nanoscale Manufacturing: Current Trends and Future Directions in Nanoelectronics
-
Invited Oral Presentation: Advanced CMOS and Related Characterization in MIRAI Project
-
Invited Oral Presentation: The Semiconductor Industry's Nanoelectronics Research Initiative
-
Invited Oral Presentation: Quantum Information Science, NIST, and Future Technological Implications
