FCMN 2019 | AVS Technical Library

FCMN 2019

54 Presentations

Poster Presentation: Ions and Chemistry to Fulfill Observation and Probing Specifications of sub-28nm devices

Presentation: G. Goupil (1), P. Gounet (2), C. Hollerith (3), F. Altmann (4), S. Brand (4) and A. Delobbe (1), 1 slide
Poster Presentation: Electric Field Gradient Reference Material for Scanning Probe Microscopy

Presentation: J. J. Kopanski, M. Fu , and L. You, 1 slide
Poster Presentation: Spatially Correlated Cathodoluminescenceand TEM of Ingaasquantum Well Grown on Silicon

Presentation: J. Roque, S. David, N.Rochat, F. Bertin, N. Gambacorti, 1 slide
Poster Presentation: Super-Resolution Single-Molecule Microscopy: a Characterization Tool for Materials

Presentation: J. Alexander Liddle, (1) Muzhou Wang, (2) Stephen Stranick, (3) Abhishek Kumar,(1,4) Jeffrey Gilman (3), 1 slide