Increased WS2 Crystal Grain Size by Controlling the Nucleation Behavior during Plasma Enhanced Atomic Layer Deposition Presentation: Benjamin Groven, KU Leuven, Belgium, 14 min 39 sec
Controlling Material Properties of Nanostructured WS2 during Plasma ALD for Improved Electrochemical Performance Presentation: Shashank Balasubramanyam, Eindhoven University of Technology, Netherlands, 15 min 28 sec
Using ALD to Engineer Metal/Insulator/Metal Devices Presentation: John Conley, Jr., Oregon State University, 33 min 27 sec
Impact of Metal Nanocrystal Size and Distribution on Resistive Switching Parameters of Oxide-based Resistive Random Access Memories by Atomic Layer Deposition Presentation: Chang Liu, Nanjing University, China, 13 min 51 sec
Epitaxial Electronic Materials by Atomic Layer Deposition Presentation: Peter J. King, University of Helsinki, Finland, 16 min 34 sec
Scaling Ferroelectric Hf0.5Zr0.5O2 for Back-end of Line Integration Presentation: Jaidah Mohan, The University of Texas at Dallas, 13 min 51 sec
Atomic Layer Deposition for Logic Device Manufacturing Presentation: Bong Jin Kuh, Samsung Electronics, 27 min 10 sec
Effect of ZrO2 Capping-layer on Ferroelectricity of HfxZr1−xO2 Thin Films by ALD using Hf/Zr Cocktail Precursor Presentation: Takashi Onaya, Meiji University, Japan, 17 min 20 sec
Efficient Photoelectrochemical H2 Generation using Molybdenum Disulfide Film on Black Si Photocathode Via Wafer-scale Atomic Layer Deposition Presentation: Dae Woong Kim, Hanyang University, Republic of Korea, 19 min 25 sec
Junction Interface Passivation by ALD in CIGS Solar Cells Presentation: Wei-Lun Xu, National Tsing Hua University, 15 min 41 sec
Spatial Atomic Layer Deposition: Up-scalable Route of Metal Oxide Functional Layers for High Efficient and Stable Perovskite Solar Cells and Modules Presentation: Valerio Zardetto, TNO/Holst Center, Netherlands, 16 min 38 sec
Applications of Atomic Layer Deposition in Solar Energy Conversion Presentation: Xianglin Li, Nanyang Technological University, Singapore, 11 min 33 sec
Inorganic Charge Transport Layers Grown via Atomic Layer Deposition for Highly Stable and Efficient Perovskite Solar Cell Presentation: Seongrok Seo, Sungkyunkwan University, Republic of Korea, 15 min 56 sec
Simultaneous Enhancement of Toughness and Elimination of the UV Sensitivity of Kevlar with a Combined ALD/MPI Process Presentation: Itxasne Azpitarte, CIC nanoGUNE, Spain, 13 min 18 sec
Mutual Synergistic Doping in Conductive Hybrid Materials Obtained after Vapor Phase Infiltration Presentation: Mato Knez, CIC nanoGUNE, Spain, 17 min 42 sec
Infiltration Synthesis of ZnO in a Non-reactive Polymer Facilitated by Residual Solvent Molecules Presentation: Chang-Yong Nam, Brookhaven National Laboratory, 11 min 34 sec
Thermal Conductivity in Layer-engineered Inorganic-Organic Thin Films Presentation: Fabian Krahl, Aalto University, Finland, 19 min 6 sec
Reversible Trans-cis Photoisomerization of ALD/MLD-fabricated Azobenzene-based Inorganic-Organic Thin Films Presentation: Aida Khayyami, Aalto University, Finland, 13 min 52 sec
Organic/Inorganic Nanocomposite Synthesis through Sequential Infiltration of 3D Printed Polymer Parts: A Microstructural Study Presentation: David J. Mandia, Argonne National Laboratory, 14 min 56 sec
Reactivity of Common ALD Precursors with OH/H2O-containing Metal Organic Framework Materials Presentation: Kui Tan, University of Texas at Dallas, 16 min 30 sec
Atomic/Molecular Layer Deposition of Inorganic-Organic Carboxylate Network Thin Films for Possible Sensing Applications Presentation: Jenna Penttinen, Aalto University, Finland, 16 min 45 sec
Open Air Processing of Innovative Transparent Conductive Materials with Spatial ALD Presentation: David Muñoz-Rojas, Grenoble INP/CNRS, France, 34 min 33 sec
Conformality of SiO2 and Al2O3 Coatings Produced using High Speed Spatial ALD with a DC Plasma Presentation: Eric Dickey, Lotus Applied Technology, 18 min 28 sec
Characterizing Precursor Delivery from Vapor Draw Ampoules Presentation: James Maslar, National Institute of Standards and Technology, 16 min 52 sec
Monitoring Conformality in ALD Manufacturing: Comparing Lateral and Vertical High Aspect Ratio Test Structures Presentation: Mikko Utriainen, VTT Technical Research Centre of Finland, 14 min 42 sec